Overlay Error and CD Metrology Carrier Concentration Depth Profiling Detection and Measurement of Impurities Electrical Properties of Semiconductors and Thin Films
Online Library and Literature Fulfillment
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Bio-Rad Process Control Tools are used throughout the world in the development, control and characterization of state of the art Semiconductor fabrication processes. Tools for both production and research applications are designed and manufactured to meet the ever shrinking dimensions of the integrated circuit. The range of tools include process control tools for measuring Overlay error, Critical dimensions, Epitaxial thickness and dopant concentrations in the silicon substrate. Systems for profiling of carrier concentration, detecting contaminants and measuring the electrical properties of wafers are also available. Manufacturing, sales, service and support facilities in all the major Semiconductor production areas enable Bio-Rad to commit the levels of service and support expected by the fast moving, 24hr a day industry. |
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QS-2200 ME FT-IR Characterization Tools from Bio-Rad
The Bio-Rad QS 2200ME is the latest in the range of FT-IR Metrology systems manufactured by Bio-Rad Semiconductor Systems Division. The QS 2200ME is fully compliant with the most recent European Community legislation and carries the CE Mark and certification.
